ANALYSIS OF NOISE AND NON-LINEARITY OF I-V CHARACTERISTICS OF POSITIVE TEMPERATURE COEFFICIENT CHIP THERMISTORS

METROLOGY AND MEASUREMENT SYSTEMS

Sita, Z; Sedlakova, V; Majzner, J; Sedlak, P; Sikula, J; Grmela, L, 2013: ANALYSIS OF NOISE AND NON-LINEARITY OF I-V CHARACTERISTICS OF POSITIVE TEMPERATURE COEFFICIENT CHIP THERMISTORS. METROLOGY AND MEASUREMENT SYSTEMS 20(4), p. 635 - 644, doi: 10.2478/mms-2013-0054

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser