Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser
CEITEC BUT CEITEC BUT
Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

Influence of scanning rate on quality of AFM image: Study of surface statistical metrics

MICROSCOPY RESEARCH AND TECHNIQUE

Sobola, D; Talu, S; Solaymani, S; Grmela, L, 2017: Influence of scanning rate on quality of AFM image: Study of surface statistical metrics. MICROSCOPY RESEARCH AND TECHNIQUE 80(12), p. 1328 - 1336, doi: 10.1002/jemt.22945

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