Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser
CEITEC BUT CEITEC BUT
Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

Investigation of excess 1/f noise in CdTe single crystals

SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Andreev, A; Grmela, L; Moravec, P; Bosman, G; Sikula, J, 2010: Investigation of excess 1/f noise in CdTe single crystals. SEMICONDUCTOR SCIENCE AND TECHNOLOGY 25(5), doi: 10.1088/0268-1242/25/5/055016

Research Groups: