Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser
CEITEC BUT CEITEC BUT
Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

Microscale localization of low light emitting spots in reversed-biased silicon solar cells

SOLAR ENERGY MATERIALS AND SOLAR CELLS

Skarvada, P; Tomanek; Grmela, L; Smith, SJ, 2010: Microscale localization of low light emitting spots in reversed-biased silicon solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS 94(12), p. 2358 - 2361, doi: 10.1016/j.solmat.2010.08.014

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