Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Korytar, D; Vagovic, P; Vegso, K; Siffalovic, P; Dobrocka, E; Jark, W; Ac, V; Zaprazny, Z; Ferrari, C; Cecilia, A; Hamann, E; Mikulik, P; Baumbach, T; Fiederle, M; Jergel, M, 2013: Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging. JOURNAL OF APPLIED CRYSTALLOGRAPHY 46, p. 945 - 952, doi: 10.1107/S0021889813006122
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