RTS Noise of CMOS Technology

MATERIALS STRUCTURE & MICROMECHANICS OF FRACTURE

Chvatal, M; Pavelka, J; Sedlakova, V; Trcka, T; Skarvada, P, 2011: RTS Noise of CMOS Technology. MATERIALS STRUCTURE & MICROMECHANICS OF FRACTURE 465, p. 334 - 337, doi: 10.4028/www.scientific.net/KEM.465.334

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

CEITEC authors:

• Vlasta Sedláková, Ph.D.