Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser
CEITEC BUT CEITEC BUT
Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

The Effect of Load (Pressure) for Quantitative EHL Film Thickness

TRIBOLOGY LETTERS

Krupka, I; Kumar, P; Bair, S; Khonsari, MM; Hartl, M, 2010: The Effect of Load (Pressure) for Quantitative EHL Film Thickness. TRIBOLOGY LETTERS 37(3), p. 613 - 622, doi: 10.1007/s11249-009-9559-7

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