X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Ferrari, C; Germini, F; Korytar, D; Mikulik, P; Peverini, L, 2011: X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. JOURNAL OF APPLIED CRYSTALLOGRAPHY 44, p. 353 - 358, doi: 10.1107/S0021889811001439
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