Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion

VAKUUM IN FORSCHUNG UND PRAXIS

ŢĂLU, Ş.; YADAV, R.; ARMAN, A.; KORPI, A.; SOBOLA, D.; TALU, M.; REZAEE, S.; ACHOUR, A.; JUREČKA, S.; MARDANI, M., 2019: Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion. VAKUUM IN FORSCHUNG UND PRAXIS 31(1), p. 30 - 6, doi: 10.1002/vipr.201900703; FULL TEXT

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

CEITEC authors:

• Dinara Sobola, Ph.D.