Fluctuations of focused electron beam in a conventional SEM

ULTRAMICROSCOPY

KNÁPEK, A.; ŠIKULA, J.; BARTLOVÁ, M., 2019: Fluctuations of focused electron beam in a conventional SEM. ULTRAMICROSCOPY 204, p. 49 - 6, doi: 10.1016/j.ultramic.2019.05.008; FULL TEXT

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser