The current and capacitance characteristics as a function of sample temperature in YMn0.90Os0.10O3/p-Si structures

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Coskun, M.; Polat, O.; Coskun, FM.; Efeoglu, H.; Caglar, M.; Durmus, Z.; Turut, A. , 2019: The current and capacitance characteristics as a function of sample temperature in YMn0.90Os0.10O3/p-Si structures. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 102, p. 1 - 7, doi: 10.1016/j.mssp.2019.104587; FULL TEXT

Research Groups:

• Fabrication and Characterisation of Nanostructures - Tomáš Šikola

CEITEC authors:

• Özgür Polat, Ph.D.