Analysis of cut orientation through half-finished product using WEDM

Materials and Manufacturing Processes

Mouralova, K.; Benes, L.; Zahradnicek, R.; Bednar, J.; Hrabec, P.; Prokes, T., Hrdy, R., 2019: Analysis of cut orientation through half-finished product using WEDM. MATERIALS AND MANUFACTURING PROCESSES 34(1), p. 70 - 82, doi: 10.1080/10426914.2018.1544714
(LYRA, HELIOS, TITAN, TEGRAMIN)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660
• High Resolution (Scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed
• Grinder/polisher Tegramin 30

Research Groups:

• CF: CEITEC Nano
• Smart Nanodevices - Vojtěch Adam

CEITEC authors:

• Radim Zahradníček, Ph.D.