Analysis of the machinability of copper alloy ampcoloy by WEDM

Materials

Mouralova, K.; Benes, L.; Prokes, T.; Bednar, J.; Zahradnicek, R.; Jankovych, R.; Fries, J.; Vontor, J., 2020: Analysis of the machinability of copper alloy ampcoloy by WEDM. MATERIALS 13(4), p. 893-1 - 893-14, doi: 10.3390/ma13040893
(LYRA, TEGRAMIN, ICON-SPM, HELIOS, TITAN)

Equipment:

• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3
• Grinder/polisher Tegramin 30
• Scanning Probe Microscope Bruker Dimension Icon
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660
• High Resolution (Scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed

Research Groups:

• CF: CEITEC Nano
• Smart Nanodevices - Vojtěch Adam

CEITEC authors:

• Radim Zahradníček, Ph.D.