Fabrication and characterization of GaN nanostuctures

Treatise to state doctoral exam

Čalkovský, V., 2020: Fabrication and characterization of GaN nanostuctures. TREATISE TO STATE DOCTORAL EXAM , p. 1 - 38
(VERIOS, KRATOS-XPS, LYRA, TITAN)

Equipment:

• High resolution Scanning Electron Microscope FEI Verios 460L
• X-ray Photoelectron Spectroscopy Kratos Analytical Axis Supra
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3
• High Resolution (Scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed

Research Groups:

• CF: CEITEC Nano
• Fabrication and Characterisation of Nanostructures - Tomáš Šikola

CEITEC authors:

• Vojtěch Čalkovský