Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures

ADVANCES IN ELECTRICAL AND ELECTRONIC ENGINEERING - INTENETOVÝ ČASOPIS (HTTP://ADVANCES.UTC.SK)

SOBOLA, D.; TALU, S.; SADOVSKÝ, P.; PAPEŽ, N.; GRMELA, L., 2017: Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures. ADVANCES IN ELECTRICAL AND ELECTRONIC ENGINEERING - INTENETOVÝ ČASOPIS (HTTP://ADVANCES.UTC.SK) , p. 569 - 8, doi: 10.15598/aeee.v15i3.2242; FULL TEXT

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

CEITEC authors:

• Dinara Sobola, Ph.D.