Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution

ZEMEK, M.; ŠALPLACHTA, J.; MÉZL, M., 2020: Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution. , p. 64 - 4; FULL TEXT

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

CEITEC authors:

• Marek Zemek
• Jakub Šalplachta