X-ray high resolution computed tomography for cultural heritage material micro-inspection

PROCEEDINGS OF SPIE

JAQUES, V.; ZEMEK, M.; ŠALPLACHTA, J.; ZIKMUND, T.; OŽVOLDÍK, D.; KAISER, J., 2021: X-ray high resolution computed tomography for cultural heritage material micro-inspection. PROCEEDINGS OF SPIE , p. 1 - 8, doi: 10.1117/12.2592310; FULL TEXT

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

CEITEC authors:

• Marek Zemek
• Jakub Šalplachta
• Tomáš Zikmund, Ph.D.
• Prof. Jozef Kaiser, Ph.D.