Cross section/broad beam ion polisher Leica EM TIC3X (TIC3X)

Detailed description:

Machine for polishing broad range of materialographic samples (metals, ceramics, plastics, organic species, composites of various types, porous materials) in cross-section or in planar polishing mode. Features three Ar ion guns displaced mutually by 45°, aiming at the same point, independently controllable. Three sample stages are available: one for ion milling in cross section, a rotary stage for planar polishing and a cryo stage for cross-section polishing of sensitive samples.

Publications:

• Suchý, J.; Klakurková, L.; Man, O.; Remešová, M.; Horynová, M.; Paloušek, D.; Koutný, D.; Krištofová, P.; Vojtěch, D.; Čelko, L., 2021: Corrosion behaviour of WE43 magnesium alloy printed using selective laser melting in simulation body fluid solution. JOURNAL OF MANUFACTURING PROCESSES , p. 556 - 566, doi: 10.1016/j.jmapro.2021.08.006; FULL TEXT
  (VERIOS, TIC3X, RIGAKU3)
• ŠŤASTNÝ, P.; VACEK, P.; TRUNEC, M., 2020: Characterization of microstructure and phase distribution of sintered multiphasic calcium phosphate bioceramics. CERAMICS INTERNATIONAL 46(4), p. 5500 - 5, doi: 10.1016/j.ceramint.2019.10.300; FULL TEXT
  (TIC3X, VERIOS, TITAN, HELIOS, RIGAKU3)