Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)

CONTACT US

Guarantor: Ondřej Man, Ph.D.
Instrument status: Some Issues Some Issues, 13.7.2021 08:08, 1) CryoMat dissassembled because of vacuum leak
Equipment placement: CEITEC Nano - A1.10
Research group: CF: CEITEC Nano


Detailed description:

FIB/SEM with sub-nm resolution, capable of imaging at very low landing energies of primary electrons (of the order of tens of volts), in-lens detection of SE and BSE, local chemical analysis. Equipped with STEM detector and EDS + EBSD analysers. Ideally suited for TEM lamella preparation and observation. Capable of 3D chemical and crystallographic analysis as well as structure reconstruction.


Publications:

  • Hudec, T.; Izai, V.; Satrapinskyy, L.; Huminiuc, T.; Roch, T.; Gregor, M.; Grančič, B.; Mikula, M.; Polcar, T., 2021: Structure, mechanical and tribological properties of MoSe2 and Mo-Se-N solid lubricant coatings. SURFACE AND COATINGS TECHNOLOGY 405, doi: 10.1016/j.surfcoat.2020.126536
    (TITAN, HELIOS)
  • Imrich, T.; Zazpe, R.; Krýsová, H.; Paušová, Š.; Dvorak, F.; Rodriguez-Pereira, J.; Michalicka, J.; Man, O.; Macak, J.M.; Neumann-Spallart, M.; Krýsa, J., 2021: Protection of hematite photoelectrodes by ALD-TiO2 capping. JOURNAL OF PHOTOCHEMISTRY AND PHOTOBIOLOGY A: CHEMISTRY 409, p. 113126-1 - 7, doi: 10.1016/j.jphotochem.2020.113126; FULL TEXT
    (TITAN, HELIOS)
  • ŘIHÁČEK, T.; HORÁK, M.; SCHACHINGER, T.; MIKA, F.; MATĚJKA, M.; KRÁTKÝ, S.; FOŘT, T.; RADLIČKA, T.; JOHNSON, C.; NOVÁK, L.; SEĎA, B.; MCMORRAN, B.; MÜLLEROVÁ, I., 2021: Beam shaping and probe characterization in the scanning electron microscope. ULTRAMICROSCOPY 225, p. 1 - 9, doi: 10.1016/j.ultramic.2021.113268; FULL TEXT
    (HELIOS, LEICACOAT-STAN)
  • Hlushko, K.; Mackova, A.; Zalesak, J.; Burghammer, M.; Davydok, A.; Krywka, C.; Daniel, R.; Keckes, J.; Todt, J., 2021: Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction. THIN SOLID FILMS 722, doi: 10.1016/j.tsf.2021.138571
    (HELIOS)
  • Bondarev, A. V.; Antonyuk, M. N.; Kiryukhantsev-Korneev, Ph V.; Polcar, T.; Shtansky, D. V., 2021: Insight into high temperature performance of magnetron sputtered Si-Ta-C-(N) coatings with an ion-implanted interlayer. APPLIED SURFACE SCIENCE 541, doi: 10.1016/j.apsusc.2020.148526; FULL TEXT
    (VERIOS, HELIOS, KRATOS-XPS, NANOINDENTER)

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