Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser
CEITEC BUT CEITEC BUT
Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

High resolution measuring with X-ray computed tomography

BŘÍNEK, A.; TESAŘOVÁ, M.; ZIKMUND, T.; KAISER, J., 2017: High resolution measuring with X-ray computed tomography. , p. 69 - 138; FULL TEXT

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