Smart Nanodevices - Vojtěch Adam
CEITEC BUT CEITEC BUT
Smart Nanodevices - Vojtěch Adam

Hysitron TI 950 (NANOINDENTER)

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Guarantor: M.Sc. Saeed Mirzaei, Ph.D.
Instrument status: Operational Operational, 21.4.2021 09:19
Equipment placement: CEITEC Nano - C1.22
Research group: CF: CEITEC Nano


Detailed description:

The TI 950 combines Hysitron’s patented three plate capacitive transducer* technology with state-of-the-art control technology to achieve unmatched performance in nanomechanical characterization. The system features a sub 30 nN force noise floor, ultra-fast feedback control, user-definable data acquisition rates up to 30 kHz, the widest range of nanomechanical testing techniques, and the ability to test with various Hysitron heads seamlessly. The superior staging system on the TI 950, along with the in-situ Scanning Probe Microscopy (SPM) imaging capability, provides unparalleled precision in test-placement accuracy and data repeatability.


Publications:

  • Bondarev, A. V.; Antonyuk, M. N.; Kiryukhantsev-Korneev, Ph V.; Polcar, T.; Shtansky, D. V., 2021: Insight into high temperature performance of magnetron sputtered Si-Ta-C-(N) coatings with an ion-implanted interlayer. APPLIED SURFACE SCIENCE 541, doi: 10.1016/j.apsusc.2020.148526; FULL TEXT
    (VERIOS, HELIOS, KRATOS-XPS, NANOINDENTER)
  • Yavas, H.; Fraile, A.; Huminiuc, T.; Sen, H. S.; Frutos, E.; Polcar, T., 2019: Deformation-Controlled Design of Metallic Nanocomposites. ACS APPLIED MATERIALS AND INTERFACES 11(49), p. 46296 - 46302, doi: 10.1021/acsami.9b12235
    (NANOINDENTER, TITAN, HELIOS)
  • Mouralova K., Benes L., Bednar J., Zahradnicek R., Prokes T., Matousek R., Hrabec P., Fiserova Z., Otoupalik J., 2019: Using a DoE for a comprehensive analysis of the surface quality and cutting speed in WED-machined hadfield steel. JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY 33(5), p. 2371 - 2386, doi: 10.1007/s12206-019-0437-4
    (LYRA, TITAN, TEGRAMIN, NANOINDENTER, HELIOS)
  • Mouralova, K.; Benes, L.; Zahradnicek, R.; Bednar, J.; Hrabec, P.; Prokes, T.; Matousek, R.; Fiala, Z., 2018: Quality of surface and subsurface layers after WEDM aluminum alloy 7475-T7351 including analysis of TEM lamella. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY 99(9-12), p. 2309 - 2326, doi: 10.1007/s00170-018-2626-1
    (LYRA, ICON-SPM, HELIOS, TITAN, TEGRAMIN, NANOINDENTER)