LiteScope (LITESCOPE)
Instrument status:
Operational, 23.6.2020 09:17
Equipment placement:
Vysoké učení technické v Brně, CEITEC
Research group:
CF: CEITEC Nano
Detailed description:
A unique atomic force microscope, the LiteScopeTM, designed for easy integration into a scanning electron microscope, represents a next-generation tool for complex in-situ characterization of samples in the field of material science, semiconductors, or life-science. It is equipped with patented CPEMTM technology allowing simultaneous acquisition and in-time correlation of both SEM and AFM signals providing outstanding imaging results.
Publications:
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SOBOLA, D.; RAMAZANOV, S.; KONEČNÝ, M.; ORUDZHEV, F.; KASPAR, P.; PAPEŽ, N.; KNÁPEK, A.; POTOČEK, M., 2020: Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate . MATERIALS 13(10), p. 1 - 15, doi: 10.3390/ma13102402; FULL TEXT
(SIMS, WITEC-RAMAN, LITESCOPE, LYRA, KRATOS-XPS) -
NOVOTNÁ, V., HORÁK, J., KONEČNÝ, M., HEGROVÁ, V., NOVOTNÝ, O., NOVÁČEK, Z., NEUMAN, J., 2020: AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis. MICROSCOPY TODAY , p. 38 - 9, doi: 10.1017/S1551929520000875; FULL TEXT
(MIRA3-XMU, LITESCOPE) -
Hegrová, V., 2019: Application of correlative AFM/SEM microscopy. MASTER´S THESIS , p. 1 - 64
(LYRA, LITESCOPE, MIRA, RIE-FLUORINE, EVAPORATOR, WIRE-BONDER)