Contact
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| Research group: | Development of Methods for Analysis and Measuring - Petr Klapetek |
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Publications that are part of the Web of Science database, possibly also other publications chosen by authors.
2017
- KLAPETEK, P.; MARTINEK, J.; GROLICH, P.; VALTR, M.; KAUR, N., 2017: Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER 108, p. 841 - 10, doi: 10.1016/j.ijheatmasstransfer.2016.12.036; FULL TEXT
- Research and development of new technologies for the production of a bipolar transistor with insulated gate (TIGBT) (TH01010419), EPSILON, 2015 - 2017
- Deposition of thermomechanically stable nanostructured diamond-like thin films in dual frequency capacitive discharges (GA202/07/1669), Czech Science Foundation - Standard Grants, 2007 - 2011
- Nanometrology using methods of scanning probe microscopy (KAN311610701), Academy of Sciences of the Czech Republic - Nanotechnologies for Society, 2007 - 2011
- Analysis of the optical properties of solar cells (FT-TA3/142), Ministry of Industry and Trade - TANDEM, 2006 - 2009