Miroslav Valtr, Ph.D.

Publications that are part of the Web of Science database, possibly also other publications chosen by authors.

2021

• KLAPETEK, P.; VALTR, M.; NEČAS, D.; LÉDL, V.; ULEHLA, L.; WITTEK, R., 2021: Technique for fusion of roughness data sets. ; FULL TEXT

2020

• GUEN, E.; KLAPETEK, P.; PUTTOCK, R.; HAY, B.; ALLARD, A.; MAXWELL, T.; CHAPUIS, P.O.; RENAHY, D.; DAVEE, G.; VALTR, M.; MARTINEK, J.; KAZAKOVA, O.; GOMES, S., 2020: SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis. INTERNATIONAL JOURNAL OF THERMAL SCIENCES , p. 1 - 9, doi: 10.1016/j.ijthermalsci.2020.106502; FULL TEXT
• KLAPETEK, P.; YACOOT, A.; HORTVÍK, V.; DUCHOŇ, V.; DONGMO, H.; ŘEŘUCHA, Š.; VALTR, M.; NEČAS, D., 2020: Multiple-fibre interferometry setup for probe sample interaction measurements in atomic force microscopy. MEASUREMENT SCIENCE AND TECHNOLOGY 31(9), p. 1 - 11, doi: 10.1088/1361-6501/ab85d8; FULL TEXT
• NEČAS, D.; VALTR, M.; KLAPETEK, P., 2020: How levelling and scan line corrections ruin roughness measurement and how to prevent it. SCIENTIFIC REPORTS 10(1), p. 1 - 15, doi: 10.1038/s41598-020-72171-8; FULL TEXT
• NEČAS, D.; KLAPETEK, P.; VALTR, M., 2020: Estimation of roughness measurement bias originating from background subtraction. MEASUREMENT SCIENCE AND TECHNOLOGY 31(9), p. 094010-1 - 15, doi: 10.1088/1361-6501/ab8993; FULL TEXT

2019

• Martinek, J; Valtr, M; Hortvik, V; Grolich, P; Briand, D; Shaker, M; Klapetek, P, 2019: Large area scanning thermal microscopy and infrared imaging system. MEASUREMENT SCIENCE AND TECHNOLOGY 30(3), doi: 10.1088/1361-6501/aafa96
• YACOOT, A.; KLAPETEK, P.; VALTR, M.; GROLICH, P.; DONGMO, H.; LAZZERINI, M.; BRIDGES, A., 2019: Design and performance of a test rig for evaluation of nanopositioning stages. MEASUREMENT SCIENCE AND TECHNOLOGY 30(3), p. 1 - 10, doi: 10.1088/1361-6501/aafd03; FULL TEXT

2018

• Guen, E.; Chapuis, PO.; Klapetek, P.; Puttock, R.; Hay, B.; Allard, A.; Maxwell, T.; Renahy, D.; Valtr, M.; Martinek, J.; Gomes, S. , 2018: Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison. , p. 1 - 6; FULL TEXT

2017

• KLAPETEK, P.; YACOOT, A.; GROLICH, P.; VALTR, M.; NEČAS, D., 2017: Gwyscan: a library to support non-equidistant scanning probe microscope measurements. MEASUREMENT SCIENCE AND TECHNOLOGY 28(3), p. 1 - 11, doi: 10.1088/1361-6501/28/3/034015; FULL TEXT
• KLAPETEK, P.; MARTINEK, J.; GROLICH, P.; VALTR, M.; KAUR, N., 2017: Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy. INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER 108, p. 841 - 10, doi: 10.1016/j.ijheatmasstransfer.2016.12.036; FULL TEXT

2016

• VALTR, M.; KLAPETEK, P., 2016: Polohovací systém pro rastrovací mikroskopy vyrobený technikou 3D tisku. ; FULL TEXT

2015

• Stepanova, V.; Slavicek, P.; Valtr, M.; Bursikova, V.; Stupavska, M., 2015: IMPROVEMENT OF GLASS WETTABILITY USING DIFFUSE COPLANAR SURFACE BARRIER DISCHARGE AND GLIDING ARC CONSIDERING AGING EFFECT. , p. 321 - 6; FULL TEXT

• Research and development of new technologies for the production of a bipolar transistor with insulated gate (TIGBT) (TH01010419), EPSILON, 2015 - 2017
• Nanometrology using methods of scanning probe microscopy (KAN311610701), Academy of Sciences of the Czech Republic - Nanotechnologies for Society, 2007 - 2011
• Deposition of thermomechanically stable nanostructured diamond-like thin films in dual frequency capacitive discharges (GA202/07/1669), Czech Science Foundation - Standard Grants, 2007 - 2011
• Analysis of the optical properties of solar cells (FT-TA3/142), Ministry of Industry and Trade - TANDEM, 2006 - 2009