NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

Detailed description:

The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities.

Publications:

• Michlicek, M; Blahova, L; Dvorakova, E; Necas, D; Zajickova, L, 2021: Deposition penetration depth and sticking probability in plasma polymerization of cyclopropylamine. APPLIED SURFACE SCIENCE 540, doi: 10.1016/j.apsusc.2020.147979; FULL TEXT
  (WOOLLAM-VIS, LYRA, FTIR, KRATOS-XPS)
• KEPIČ, P.; LIGMAJER, F.; HRTOŇ, M.; REN, H.; MENEZES, L.; MAIER, S.; ŠIKOLA, T., 2021: Optically Tunable Mie Resonance VO2 Nanoantennas for Metasurfaces in the Visible. ACS PHOTONICS 8(4), p. 1048 - 10, doi: 10.1021/acsphotonics.1c00222; FULL TEXT
  (EVAPORATOR, MIRA, WITEC-RAMAN, WOOLLAM-VIS)
• Mascaretti, L.; Barman, T.; Bricchi, B. R.; Münz, F.; Li Bassi, A.; Kment, Š.; Naldoni, A., 2021: Controlling the plasmonic properties of titanium nitride thin films by radiofrequency substrate biasing in magnetron sputtering. APPLIED SURFACE SCIENCE 554, doi: 10.1016/j.apsusc.2021.149543; FULL TEXT
  (WOOLLAM-VIS)
• Číž, T., 2020: X-ray diffraction analysis of oxide layers. MASTER´S THESIS
  (KRATOS-XPS, WOOLLAM-VIS, RIGAKU9, SIMS)
• Papez, N; Gajdos, A; Sobola, D; Dallaev, R; Macku, R; Skarvada, P; Grmela, L, 2020: Effect of gamma radiation on properties and performance of GaAs based solar cells. APPLIED SURFACE SCIENCE 527, p. 146766-1 - 146766-11, doi: 10.1016/j.apsusc.2020.146766
  (LYRA, WOOLLAM-VIS, SIMS, FTIR, WITEC-RAMAN)

• SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S., 2019: Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE-POLAND 37(2), p. 1 - 6, doi: 10.2478/msp-2019-0030; FULL TEXT
  (WOOLLAM-VIS, VERIOS, TERS)
• GABLECH, I.; SVATOŠ, V.; CAHA, O.; DUBROKA, A.; PEKÁREK, J.; KLEMPA, J.; NEUŽIL, P.; SCHNEIDER, M.; ŠIKOLA, T., 2019: Preparation of high-quality stress-free (001) aluminum nitride thin film using a dual kaufman ion-beam source setup. THIN SOLID FILMS 670, p. 105 - 8, doi: 10.1016/j.tsf.2018.12.035; FULL TEXT
  (KAUFMAN, ICON-SPM, RIGAKU9, WOOLLAM-VIS)
• Pokorný, D., 2019: Morphology study of ultra thin layers by XPS analysis of multiple peaks of a single element. MASTER´S THESIS , p. 1 - 71
  (WOOLLAM-VIS, ALD, KRATOS-XPS)
• Vida, J., 2019: Deposition of ternary oxides with titanium and characterization of their optical and electrical properties. MASTER´S THESIS , p. 1 - 50
  (ALD, WOOLLAM-VIS, VUVAS, EVAPORATOR, SUSS-MA8, SUMMIT, KRATOS-XPS, RIGAKU3)
• KAUSHIK, P.; ELIÁŠ, M.; MICHALIČKA, J.; HEGEMANN, D.; PYTLÍČEK, Z.; NEČAS, D.; ZAJÍČKOVÁ, L., 2019: Atomic layer deposition of titanium dioxide on multi-walled carbon nanotubes for ammonia gas sensing. SURFACE AND COATINGS TECHNOLOGY 370, p. 235 - 9, doi: 10.1016/j.surfcoat.2019.04.031; FULL TEXT
  (ALD, EVAPORATOR, PECVD-NANOFAB, WOOLLAM-VIS, VERIOS, TITAN, KRATOS-XPS, RIGAKU3)
• KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L., 2019: Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. APPLIED SURFACE SCIENCE 493, p. 673 - 6, doi: 10.1016/j.apsusc.2019.07.058; FULL TEXT
  (EVAPORATOR, WOOLLAM-VIS, ICON-SPM, KRATOS-XPS)
• Friš, P.; Munzar, D.; Caha, O.; Dubroka, A., 2018: Direct observation of double exchange in ferromagnetic La0.7Sr0.3CoO3 by broadband ellipsometry. PHYSICAL REVIEW B 97(4), p. 045137-1 - 045137-5, doi: 10.1103/PhysRevB.97.045137
  (WOOLLAM-MIR, WOOLLAM-VIS, RIGAKU9, FTIR, CRYOGENIC)
• TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O., 2018: How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 85, p. 15 - 9, doi: 10.1016/j.mssp.2018.05.030; FULL TEXT
  (VERIOS, TERS, WOOLLAM-VIS)
• Dvořák, P., 2018: Nanophotonics. PH.D. THESIS , p. 1 - 134
  (SNOM-NANONICS, LYRA, TERS, EVAPORATOR, FTIR, WOOLLAM-VIS)
• Ligmajer, F., 2018: Advanced plasmonic materials for metasurfaces and photochemistry. PH.D. THESIS , p. 1 - 142
  (VERIOS, ICON-SPM, RIGAKU9, SNOM-NANONICS, FTIR, WOOLLAM-VIS, TITAN)
• KLENOVSKÝ, P.; ZŮDA, J.; KLAPETEK, P.; HUMLÍČEK, J., 2017: Ellipsometry of surface layers on a 1-kg sphere from natural silicon. APPLIED SURFACE SCIENCE 421, p. 542 - 5, doi: 10.1016/j.apsusc.2016.08.135; FULL TEXT
  (WOOLLAM-VIS)
• Dubroka, A; Caha, O; Hroncek, M; Fris, P; Orlita, M; Holy, V; Steiner, H; Bauer, G; Springholz, G; Humlicek, J, 2017: Interband absorption edge in the topological insulators Bi-2(Te1-xSex)(3). PHYSICAL REVIEW B 96(23), doi: 10.1103/PhysRevB.96.235202
  (FTIR, RIGAKU9, WOOLLAM-MIR, WOOLLAM-VIS)
• Fris, P.; Dubroka, A., 2017: Vacuum variable-angle far-infrared ellipsometer. APPLIED SURFACE SCIENCE 421, p. 430 - 434, doi: 10.1016/j.apsusc.2016.10.125
  (FTIR, WOOLLAM-VIS)
• Kukolova, A., 2017: Experimental study of electronic properties of manganites and electron stimulated desorption. MASTER´S THESIS , p. 1 - 91
  (WOOLLAM-MIR, WOOLLAM-VIS, CRYOGENIC)

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