Ondřej Šik, Ph.D.

Publications that are part of the Web of Science database, possibly also other publications chosen by authors.

2019

• HUBÁLEK, J.; ŠIK, O.; MÜNZ, F.; VOBORNÝ, S.; GABLECH, I., 2019: Optický detektor viditelného a blízkého infračerveného spektra záření. ; FULL TEXT

2018

• TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O., 2018: How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 85, p. 15 - 9, doi: 10.1016/j.mssp.2018.05.030; FULL TEXT
  (VERIOS, TERS, WOOLLAM-VIS)
• ŠIK, O.; VOBORNÝ, S.; MÜNZ, F.; HUBÁLEK, J., 2018: Epitaxní vrstva GaN nadeponovaná vysokoteplotní aparaturou MOCVD. ; FULL TEXT
• ŠIK, O.; MÜNZ, F.; VOBORNÝ, S.; HUBÁLEK, J., 2018: Epitaxní vrstva InN nadeponovaná nízkoteplotní aparaturou MOCVD. ; FULL TEXT
• ŠIK, O.; BÁBOR, P.; POLČÁK, J.; BELAS, E.; MORAVEC, P.; GRMELA, L.; STANĚK, J., 2018: Low Energy Ion Scattering as a depth profiling tool for thin layers - Case of bromine Methanol etched CdTe. VACUUM 152, p. 138 - 7, doi: 10.1016/j.vacuum.2018.03.014; FULL TEXT
  (UHV-LEIS, KRATOS-XPS)
• ŠIK, O.; ŠKVARENINA, Ľ.; CAHA, O.; MORAVEC, P.; ŠKARVADA, P.; BELAS, E.; GRMELA, L., 2018: Determining the sub-surface damage of CdTe single crystals after lapping. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 29(11), p. 9652 - 10, doi: 10.1007/s10854-018-9002-7; FULL TEXT
  (RIGAKU9, HELIOS, DEKTAK)
• ŠIK, O.; VOBORNÝ, S.; MÜNZ, F.; HUBÁLEK, J., 2018: Epitaxní vrstva AlN nadeponovaná vysokoteplotní aparaturou MOCVD. ; FULL TEXT

2016

• ŠIK, O.; BÁBOR, P.; ŠKARVADA, P.; POTOČEK, M.; TRČKA, T.; GRMELA, L.; BELAS, E., 2016: Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties . SURFACE AND COATINGS TECHNOLOGY 306, p. 75 - 7, doi: 10.1016/j.surfcoat.2016.05.006; FULL TEXT

2015

• ELHADIDY, H.; GRILL, R.; FRANC, J.; ŠIK, O.; MORAVEC, P.; SCHNEEWEISS, O., 2015: Ion electromigration in CdTe Schottky Metal-Semiconductor-Metal Structure. SOLID STATE IONICS 278, p. 20 - 6, doi: 10.1016/j.ssi.2015.04.016; FULL TEXT

2013

• GRMELA, L.; ŠIK, O., 2013: Metal-Semiconductor Junction Role in CdTe Detectors. 2012 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID STATE CIRCUIT (EDSSC) , p. 22 - 4, doi: 10.2478/aeei-2013-0004; FULL TEXT

• On Semi TAČR, Výzkum a vývoj vysokonapěťových Si diod pro efektivní konverzi vysokých proudových výkonů (TH03010006 CF), Technologická agentura ČR, 2018 - 2020
• Nano-Electro-Bio-Tools for Biochemical and Molecularly-Biological Studies of Eukaryotic Cells (NanoBioTECell) (GAP102/11/1068), Czech Science Foundation - Standard Grants, 2011 - 2015
• Study of contribution of different DNA-damaging mechanisms to toxicity of cytostatics to human chemosensitive and chemoresistant neuroblastomas (GAP301/10/0356), Czech Science Foundation - Standard Grants, 2010 - 2014
• International Cooperation in the Field of Nanotechnologies with In Vivo Imaging Techniques (CZ.1.07/2.3.00/20.0148), MEYS - OP Education for Competiteveness, 2012 - 2014
• Support of the development of high-quality teams in R&D in the field of material science (CZ.1.07/2.3.00/20.0029), MEYS - OP Education for Competiteveness, 2011 - 2014
• Partner Network for Bionanotechnological and Metallomic Research (CZ.1.07/2.4.00/31.0023), MEYS - OP Education for Competiteveness, 2012 - 2014
• New design and exploiting nanobiosensors and nanosensors to target medicine (KAN208130801), Academy of Sciences of the Czech Republic - Nanotechnologies for Society, 2008 - 2012