Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films

THIN SOLID FILMS

Franta, D; Necas, D; Zajickova, L; Bursikova, V; Cobet, C, 2011: Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films. THIN SOLID FILMS 519(9), p. 2694 - 2697, doi: 10.1016/j.tsf.2010.12.059

Research Groups:

• Development of Methods for Analysis and Measuring - Petr Klapetek

CEITEC authors:

• David Nečas, Ph.D.