David Nečas, Ph.D.

Publications that are part of the Web of Science database, possibly also other publications chosen by authors.

2021

• KLAPETEK, P.; VALTR, M.; NEČAS, D.; LÉDL, V.; ULEHLA, L.; WITTEK, R., 2021: Technique for fusion of roughness data sets. ; FULL TEXT

2020

• Garnaes, J.; Necas, D.; Nielsen, L.; Madsen, MH.; Torras-Rosell, A.; Zeng, G.; Klapetek, P.; Yacoot, A., 2020: Algorithms for using silicon steps for scanning probe microscope evaluation. METROLOGIA 57(6), p. 064002-1 - 14, doi: 10.1088/1681-7575/ab9ad3; FULL TEXT
• KLAPETEK, P.; YACOOT, A.; HORTVÍK, V.; DUCHOŇ, V.; DONGMO, H.; ŘEŘUCHA, Š.; VALTR, M.; NEČAS, D., 2020: Multiple-fibre interferometry setup for probe sample interaction measurements in atomic force microscopy. MEASUREMENT SCIENCE AND TECHNOLOGY 31(9), p. 1 - 11, doi: 10.1088/1361-6501/ab85d8; FULL TEXT
• NEČAS, D.; VALTR, M.; KLAPETEK, P., 2020: How levelling and scan line corrections ruin roughness measurement and how to prevent it. SCIENTIFIC REPORTS 10(1), p. 1 - 15, doi: 10.1038/s41598-020-72171-8; FULL TEXT
• NEČAS, D.; KLAPETEK, P.; VALTR, M., 2020: Estimation of roughness measurement bias originating from background subtraction. MEASUREMENT SCIENCE AND TECHNOLOGY 31(9), p. 094010-1 - 15, doi: 10.1088/1361-6501/ab8993; FULL TEXT
• HU, X.; PUTTOCK, R.; KAZAKOVA, O.; ULVR, M.; KLAPETEK, P.; NEČAS, D.; NEU, V., 2020: Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 511, p. 166947-1 - 11, doi: 10.1016/j.jmmm.2020.166947; FULL TEXT
• ONDRAČKA, P.; NEČAS, D.; CARETTE, M.; ELISABETH, S.; HOLEC, D.; GRANIER, A.; GOULLET, A.; ZAJÍČKOVÁ, L.; RICHARD-PLOUET, M., 2020: Unravelling local environments in mixed TiO2-SiO2 thin films by XPS and ab initio calculations. APPLIED SURFACE SCIENCE 510, p. 145056-1 - 11, doi: 10.1016/j.apsusc.2019.145056; FULL TEXT
• ČERNOCHOVÁ, P.; BLAHOVÁ, L.; MEDALOVÁ, J.; NEČAS, D.; MICHLÍČEK, M.; KAUSHIK, P.; PŘIBYL, J.; BARTOŠÍKOVÁ, J.; MANAKHOV, A.; BAČÁKOVÁ, L.; ZAJÍČKOVÁ, L., 2020: Cell type specific adhesion to surfaces functionalised by amine plasma polymers. SCIENTIFIC REPORTS 10(1), p. 1 - 14, doi: 10.1038/s41598-020-65889-y; FULL TEXT
  (ICON-SPM, SEE-SYSTEM)

2019

• Hefny, MM; Necas, D; Zajickova, L; Benedikt, J, 2019: The transport and surface reactivity of O atoms during the atmospheric plasma etching of hydrogenated amorphous carbon films. PLASMA SOURCES SCIENCE & TECHNOLOGY 28(3), doi: 10.1088/1361-6595/ab0354
• KAUSHIK, P.; ELIÁŠ, M.; MICHALIČKA, J.; HEGEMANN, D.; PYTLÍČEK, Z.; NEČAS, D.; ZAJÍČKOVÁ, L., 2019: Atomic layer deposition of titanium dioxide on multi-walled carbon nanotubes for ammonia gas sensing. SURFACE AND COATINGS TECHNOLOGY 370, p. 235 - 9, doi: 10.1016/j.surfcoat.2019.04.031; FULL TEXT
  (ALD, EVAPORATOR, PECVD-NANOFAB, WOOLLAM-VIS, VERIOS, TITAN, KRATOS-XPS, RIGAKU3)
• NEČAS, D.; KLAPETEK, P.; NEU, V.; HAVLÍČEK, M.; PUTTOCK, R.; KAZAKOVA, O.; HU, X.; ZAJÍČKOVÁ, L., 2019: Determination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method. SCIENTIFIC REPORTS 9, p. 1 - 15, doi: 10.1038/s41598-019-40477-x; FULL TEXT
  (ICON-SPM)

2018

• OHLÍDAL, M.; VODÁK, J.; NEČAS, D., 2018: Optical Characterization Of Thin Films by Means of Imaging Spectroscopic Reflectometry. OPTICAL CHARACTERIZATION OF THIN SOLID FILMS 64, p. 107 - 34, doi: 10.1007/978-3-319-75325-6_5; FULL TEXT
• Necas, D, 2018: Data Processing Methods for Imaging Spectrophotometry. OPTICAL CHARACTERIZATION OF THIN SOLID FILMS 64, p. 143 - 175, doi: 10.1007/978-3-319-75325-6_6
• Manakhov, A; Fukova, S; Necas, D; Michlicek, M; Ershov, S; Elias, M; Visotin, M; Popov, Z; Zajickova, L, 2018: Analysis of epoxy functionalized layers synthesized by plasma polymerization of allyl glycidyl ether. PHYSICAL CHEMISTRY CHEMICAL PHYSICS 20(30), p. 20070 - 20077, doi: 10.1039/c8cp01452c
  (ICON-SPM, KRATOS-XPS)

2017

• Manakhov, A;, Michlicek, M; Felten, A; Pireaux, J J; Necas, D; Zajickova, L., 2017: XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach. APPLIED SURFACE SCIENCE (394), p. 578 - 585, doi: 10.1016/j.apsusc.2016.10.099
  (ICON-SPM)
• MANAKHOV, A.; LANDOVÁ, M.; MEDALOVÁ, J.; MICHLÍČEK, M.; POLČÁK, J.; NEČAS, D.; ZAJÍČKOVÁ, L., 2017: Cyclopropylamine plasma polymers for increased cell adhesion and growth. PLASMA PROCESSES AND POLYMERS 14(7), p. e1600123-1 - 12, doi: 10.1002/ppap.201600123; FULL TEXT
  (LYRA, ICON-SPM, DEKTAK)
• Franta, D; Necas, D; Giglia, A; Franta, P; Ohlidal, I, 2017: Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride. APPLIED SURFACE SCIENCE 421, p. 424 - 429, doi: 10.1016/j.apsusc.2016.09.149
• Ohlidal, I; Franta, D; Necas, D, 2017: Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness. APPLIED SURFACE SCIENCE 421, p. 687 - 696, doi: 10.1016/j.apsusc.2016.10.186
• Vodak, J; Necas, D; Pavlinak, D; Macak, JM; Ricica, T; Jambor, R; Ohlidal, M, 2017: Application of imaging spectroscopic reflectometry for characterization of gold reduction from organometallic compound by means of plasma jet technology. APPLIED SURFACE SCIENCE 396, p. 284 - 290, doi: 10.1016/j.apsusc.2016.10.122
• Vodak, J; Necas, D; Ohlidal, M; Ohlidal, I, 2017: Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution. MEASUREMENT SCIENCE AND TECHNOLOGY 28(2), doi: 10.1088/1361-6501/aa5534
• NEČAS, D.; KLAPETEK, P., 2017: Study of user influence in routine SPM data processing. MEASUREMENT SCIENCE AND TECHNOLOGY 28(3), p. 1 - 11, doi: 10.1088/1361-6501/28/3/034014; FULL TEXT
• Zajickova, L; Jelinek, P; Obrusnik, A; Vodak, J; Necas, D, 2017: Plasma-enhanced CVD of functional coatings in Ar/maleic anhydride/C2H2 homogeneous dielectric barrier discharges at atmospheric pressure. PLASMA PHYSICS AND CONTROLLED FUSION 59(3), p. 034003-1 - 034003-13, doi: 10.1088/1361-6587/aa52e7
  (ICON-SPM)
• Ondracka, P; Holec, D; Necas, D; Kedronova, E; Elisabeth, S; Goullet, A; Zajickova, L, 2017: Optical properties of TixSi1-xO2 solid solutions. PHYSICAL REVIEW B 95(19), doi: 10.1103/PhysRevB.95.195163
  (VUVAS, RIGAKU3)
• BANNOV, A.; JAŠEK, O.; MANAKHOV, A.; MÁRIK, M.; NEČAS, D.; ZAJÍČKOVÁ, L., 2017: High-Performance Ammonia Gas Sensors Based on Plasma Treated Carbon Nanostructures. IEEE SENSORS JOURNAL 17(7), p. 1964 - 7, doi: 10.1109/JSEN.2017.2656122; FULL TEXT
  (ICON-SPM)
• KLAPETEK, P.; YACOOT, A.; GROLICH, P.; VALTR, M.; NEČAS, D., 2017: Gwyscan: a library to support non-equidistant scanning probe microscope measurements. MEASUREMENT SCIENCE AND TECHNOLOGY 28(3), p. 1 - 11, doi: 10.1088/1361-6501/28/3/034015; FULL TEXT

2016

• MANAKHOV, A.; MAKHNEVA, E.; SKLÁDAL, P.; NEČAS, D.; ČECHAL, J.; KALINA, L.; ELIÁŠ, M.; ZAJÍČKOVÁ, L., 2016: The robust bio-immobilization based on pulsed plasma polymerization of cyclopropylamine and glutaraldehyde coupling chemistry. APPLIED SURFACE SCIENCE 360, p. 28 - 9, doi: 10.1016/j.apsusc.2015.10.178; FULL TEXT
• Necas, D; Ohlidal, I; Franta, D; Ohlidal, M; Vodak, J, 2016: Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry. JOURNAL OF OPTICS 18(1), doi: 10.1088/2040-8978/18/1/015401
• Ondracka, P; Holec, D; Necas, D; Zajickova, L, 2016: Accurate prediction of band gaps and optical properties of HfO2. JOURNAL OF PHYSICS D-APPLIED PHYSICS 49(39), doi: 10.1088/0022-3727/49/39/395301
• MANAKHOV, A.; MICHLÍČEK, M.; NEČAS, D.; POLČÁK, J.; MAKHNEVA, E.; ELIÁŠ, M.; ZAJÍČKOVÁ, L., 2016: Carboxyl-rich coatings deposited by atmospheric plasma co-polymerization of maleic anhydride and acetylene. SURFACE AND COATINGS TECHNOLOGY 295, p. 37 - 9, doi: 10.1016/j.surfcoat.2015.11.039; FULL TEXT
  (FTIR, ICON-SPM, LYRA, MAGNETRON)
• Franta, D; Necas, D; Ohlidal, I; Giglia, A, 2016: Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range. OPTICAL MICRO- AND NANOMETROLOGY VI 9890, doi: 10.1117/12.2227580

2015

• Ohlidal, M; Ohlidal, I; Necas, D; Vodak, J; Franta, D; Nadasky, P; Vizda, F, 2015: Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films. OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V 9628, doi: 10.1117/12.2191052
• Necas, D; Ohlidal, I; Vodak, J; Ohlidal, M; Franta, D, 2015: Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry. OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V 9628, doi: 10.1117/12.2190091
• Franta, D; Necas, D; Ohlidal, I; Giglia, A, 2015: Dispersion model for optical thin films applicable in wide spectral range. OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V 9628, doi: 10.1117/12.2190104
• Franta, D; Necas, D; Ohlidal, I; Jankuj, J, 2015: Wide spectral range characterization of antireflective coatings and their optimization. OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V 9628, doi: 10.1117/12.2190109
• Franta, D; Necas, D; Ohlidal, I, 2015: Universal dispersion model for characterization of optical thin films over a wide spectral range: application to hafnia. APPLIED OPTICS 54(31), p. 9108 - 9119, doi: 10.1364/AO.54.009108
• Manakhov, A; Necas, D; Cechal, J; Pavlinak, D; Elias, M; Zajickova, L, 2015: Deposition of stable amine coating onto polycaprolactone nanofibers by low pressure cyclopropylamine plasma polymerization. THIN SOLID FILMS 581, p. 7 - 13, doi: 10.1016/j.tsf.2014.09.015
• Necas, D; Vodak, J; Ohlidal, I; Ohlidal, M; Majumdar, A; Zajickkova, L, 2015: Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry. APPLIED SURFACE SCIENCE 350, p. 149 - 155, doi: 10.1016/j.apsusc.2015.01.093

2014

• Franta, D; Necas, D; Zajickova, L; Ohlidal, I, 2014: Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen. THIN SOLID FILMS 571, p. 490 - 495, doi: 10.1016/j.tsf.2014.03.059
• Ohlidal, I; Franta, D; Necas, D, 2014: Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces. THIN SOLID FILMS 571, p. 695 - 700, doi: 10.1016/j.tsf.2014.02.092
• Manakhov, A; Skladal, P; Necas, D; Cechal, J; Polcak, J; Elias, M; Zajickova, L, 2014: Cyclopropylamine plasma polymers deposited onto quartz crystal microbalance for biosensing application. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 211(12), p. 2801 - 2808, doi: 10.1002/pssa.201431399
  (FTIR)
• Franta, D; Necas, D; Zajickova, L; Ohlidal, I, 2014: Broadening of dielectric response and sum rule conservation. THIN SOLID FILMS 571, p. 496 - 501, doi: 10.1016/j.tsf.2013.11.148
• Necas, D; Ohlidal, I; Franta, D; Cudek, V; Ohlidal, M; Vodak, J; Sladkova, L; Zajickova, L; Elias, M; Vizd´a, F, 2014: Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry. THIN SOLID FILMS 571, p. 573 - 578, doi: 10.1016/j.tsf.2013.12.036
• Manakhov, A; Zajickova, L; Elias, M; Cechal, J; Polcak, J; Hnilica, J; Bittnerova, S; Necas, D, 2014: Optimization of Cyclopropylamine Plasma Polymerization toward Enhanced Layer Stability in Contact with Water. PLASMA PROCESSES AND POLYMERS 11(6), p. 532 - 544, doi: 10.1002/ppap.201300177
  (LYRA, FTIR, DEKTAK)
• Necas, D; Ohlidal, I, 2014: Consolidated series for efficient calculation of the reflection and transmission in rough multilayers. OPTICS EXPRESS 22(4), p. 4499 - 4515, doi: 10.1364/OE.22.004499
• KLAPETEK, P.; NEČAS, D., 2014: Independent analysis of mechanical data from atomic force microscopy. MEASUREMENT SCIENCE AND TECHNOLOGY 25(4), p. 1 - 8, doi: 10.1088/0957-0233/25/4/044009; FULL TEXT
• Franta, D; Necas, D; Zajickova, L; Ohlidal, I, 2014: Dispersion model of two-phonon absorption: application to c-Si. OPTICAL MATERIALS EXPRESS 4(8), p. 1641 - 1656, doi: 10.1364/OME.4.001641
• Necas, D; Ohlidal, I; Franta, D; Ohlidal, M; Cudek, V; Vodak, J, 2014: Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films. APPLIED OPTICS 53(25), p. 5606 - 5614, doi: 10.1364/AO.53.005606
• Necas, D; Cudek, V; Vodak, J; Ohlidal, M; Klapetek, P; Benedikt, J; Rugner, K; Zajickova, L, 2014: Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry. MEASUREMENT SCIENCE & TECHNOLOGY 25(11), doi: 10.1088/0957-0233/25/11/115201

2013

• NEČAS, D.; KLAPETEK, P., 2013: One-dimensional autocorrelation and power spectrum density functions of irregularregions. ULTRAMICROSCOPY 124, p. 13 - 7, doi: 10.1016/j.ultramic.2012.08.002; FULL TEXT
• Necas, D; Franta, D; Ohlidal, I; Poruba, A; Wostry, P, 2013: Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films. SURFACE AND INTERFACE ANALYSIS 45(7), p. 1188 - 1192, doi: 10.1002/sia.5250
• Franta, D; Necas, D; Zajickova, L; Ohlidal, I; Stuchlik, J, 2013: Advanced modeling for optical characterization of amorphous hydrogenated silicon films. THIN SOLID FILMS 541, p. 12 - 16, doi: 10.1016/j.tsf.2013.04.129

2012

• NEČAS, D.; KLAPETEK, P., 2012: Gwyddion: an open-source software for SPM data analysis. CENTRAL EUROPEAN JOURNAL OF PHYSICS 10(1), p. 181 - 8, doi: 10.2478/s11534-011-0096-2; FULL TEXT
• Korotvicka, A; Necas, D; Kotora, M, 2012: Rhodium-catalyzed C-C Bond Cleavage Reactions - An Update. CURRENT ORGANIC CHEMISTRY 16(10), p. 1170 - 1214

2011

• Klapetek, P; Necas, D; Campbellova, A; Yacoot, A; Koenders, L, 2011: Methods for determining and processing 3D errors and uncertainties for AFM data analysis. MEASUREMENT SCIENCE & TECHNOLOGY 22(2), doi: 10.1088/0957-0233/22/2/025501
• Ohlidal, M; Ohlidal, I; Klapetek, P; Necas, D; Majumdar, A, 2011: Measurement of the thickness distribution and optical constants of non-uniform thin films. MEASUREMENT SCIENCE & TECHNOLOGY 22(8), doi: 10.1088/0957-0233/22/8/085104
• Klapetek, P; Valtr, M; Necas, D; Salyk, O; Dzik, P, 2011: Atomic force microscopy analysis of nanoparticles in non-ideal conditions. NANOSCALE RESEARCH LETTERS 6, doi: 10.1186/1556-276X-6-514
• Necas, D; Ohlidal, I; Franta, D, 2011: Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films. JOURNAL OF OPTICS 13(8), doi: 10.1088/2040-8978/13/8/085705
• Franta, D; Ohlidal, I; Necas, D; Vizda, F; Caha, O; Hason, M; Pokorny, P, 2011: Optical characterization of HfO2 thin films. THIN SOLID FILMS 519(18), p. 6085 - 6091, doi: 10.1016/j.tsf.2011.03.128
• Zajickova, L; Franta, D; Necas, D; Bursikova, V; Muresan, M; Perina, V; Cobet, C, 2011: Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture. THIN SOLID FILMS 519(13), p. 4299 - 4308, doi: 10.1016/j.tsf.2011.02.021
• Franta, D; Necas, D; Zajickova, L; Bursikova, V; Cobet, C, 2011: Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films. THIN SOLID FILMS 519(9), p. 2694 - 2697, doi: 10.1016/j.tsf.2010.12.059
• Franta, D; Necas, D; Ohlidal, I, 2011: Anisotropy-enhanced depolarization on transparent film/substrate system. THIN SOLID FILMS 519(9), p. 2637 - 2640, doi: 10.1016/j.tsf.2010.12.113

2010

• Klapetek, P; Valtr, M; Poruba, A; Necas, D; Ohlidal, M, 2010: Rough surface scattering simulations using graphics cards. APPLIED SURFACE SCIENCE 256(18), p. 5640 - 5643, doi: 10.1016/j.apsusc.2010.03.028
• Muresan, MG; Zajickova, L; Bursikova, V; Franta, D; Necas, D, 2010: PREPARATION AND CHARACTERIZATION OF DLC:N FILMS. NANOCON 2010, 2ND INTERNATIONAL CONFERENCE , p. 434 - 440

2009

• Ohlidal, M; Ohlidal, I; Klapetek, P; Necas, D, 2009: PRECISE MEASUREMENT OF THICKNESS DISTRIBUTION OF NONUNIFORM THIN FILMS BY IMAGING SPECTROSCOPIC REFLECTOMETRY. XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS , p. 100 - 105
• Ohlidal, M; Ohlidal, I; Klapetek, P; Necas, D; Bursikova, V, 2009: Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films. DIAMOND AND RELATED MATERIALS 18(2-3), p. 384 - 387

• Plasma and ion-implanatation processing of microporous polymer nanomaterials for bioapplications (21-12132J), Grantová agentura ČR, Czech Science Foundation, 2021 - 2023
• Research and development of new technologies for the production of a bipolar transistor with insulated gate (TIGBT) (TH01010419), EPSILON, 2015 - 2017
• Deposition of thermomechanically stable nanostructured diamond-like thin films in dual frequency capacitive discharges (GA202/07/1669), Czech Science Foundation - Standard Grants, 2007 - 2011
• Nanometrology using methods of scanning probe microscopy (KAN311610701), Academy of Sciences of the Czech Republic - Nanotechnologies for Society, 2007 - 2011
• Analysis of the optical properties of solar cells (FT-TA3/142), Ministry of Industry and Trade - TANDEM, 2006 - 2009