Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films

APPLIED OPTICS

Necas, D; Ohlidal, I; Franta, D; Ohlidal, M; Cudek, V; Vodak, J, 2014: Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films. APPLIED OPTICS 53(25), p. 5606 - 5614, doi: 10.1364/AO.53.005606

Research Groups:

• Development of Methods for Analysis and Measuring - Petr Klapetek

CEITEC authors:

• David Nečas, Ph.D.