Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry

JOURNAL OF OPTICS

Necas, D; Ohlidal, I; Franta, D; Ohlidal, M; Vodak, J, 2016: Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry. JOURNAL OF OPTICS 18(1), doi: 10.1088/2040-8978/18/1/015401

Research Groups:

• Development of Methods for Analysis and Measuring - Petr Klapetek

CEITEC authors:

• David Nečas, Ph.D.