Unravelling local environments in mixed TiO2-SiO2 thin films by XPS and ab initio calculations

APPLIED SURFACE SCIENCE

ONDRAČKA, P.; NEČAS, D.; CARETTE, M.; ELISABETH, S.; HOLEC, D.; GRANIER, A.; GOULLET, A.; ZAJÍČKOVÁ, L.; RICHARD-PLOUET, M., 2020: Unravelling local environments in mixed TiO2-SiO2 thin films by XPS and ab initio calculations. APPLIED SURFACE SCIENCE 510, p. 145056-1 - 11, doi: 10.1016/j.apsusc.2019.145056; FULL TEXT

Research Groups:

• Development of Methods for Analysis and Measuring - Petr Klapetek
• Advanced Low-Dimensional Nanomaterials - Jan Macák

CEITEC authors:

• David Nečas, Ph.D.
• Lenka Zajíčková, Ph.D.