Quality assessment of ZnO-based varistors by 1/f noise

MICROELECTRONICS RELIABILITY

Hasse, LZ; Babicz, S; Kaczmarek, L; Smulko, JM; Sedlakova, V, 2014: Quality assessment of ZnO-based varistors by 1/f noise. MICROELECTRONICS RELIABILITY 54(1), p. 192 - 199, doi: 10.1016/j.microrel.2013.09.007

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

CEITEC authors:

• Vlasta Sedláková, Ph.D.