Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II (TERS)

Scanning Probe Microscope + microRaman + PhotoLuminiscence system NT-MDT Ntegra Spectra + Solar II
CONTACT US

Guarantor: Filip Münz, Ph.D.
Technology / Methodology: Optical measurements
Instrument status: Operational Operational, 9.2.2018 16:48
Research group: CF: CEITEC Nano


Detailed description:

NTEGRA Spectra is a UV-VIS-NIR combined AFM + Raman spectrometer by NT-MDT equipped also with standard optical microscope with mapping feature for conventional micro Raman spectroscopy. The equipment is capable of full polarisation measurements (for e.g. for luminescence measurement). The equipment is placed on an air floating bedboard in the clean rooms service area.


Publications:

  • Rozbořil, J., 2019: Growth and characterization of thin films of functional molecules. PH.D. THESIS , p. 1 - 115
    (RIGAKU9, ICON-SPM, TERS, NIRQUEST512)
  • SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S., 2019: Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE-POLAND 37(2), p. 1 - 6, doi: 10.2478/msp-2019-0030; FULL TEXT
    (WOOLLAM-VIS, VERIOS, TERS)
  • Mouralova, K.; Zahradnicek, R.; Bednar, J., 2019: Study of vertical graphene growth on silver substrate based on design of experiment. DIAMOND AND RELATED MATERIALS 97, p. 107439-1 - 107439-7, doi: 10.1016/j.diamond.2019.107439
    (EVAPORATOR, PECVD-NANOFAB, VERIOS, TERS, HELIOS, ICON-SPM, TITAN)
  • KNÁPEK, A.; SOBOLA, D.; BURDA, D.; DAŇHEL, A.; MOUSA, M.; KOLAŘÍK, V., 2019: Polymer Graphite Pencil Lead as a Cheap Alternative for Classic Conductive SPM Probes . NANOMATERIALS 9(12), p. 1 - 12, doi: 10.3390/nano9121756; FULL TEXT
    (TERS, HELIOS)
  • REDONDO, J.; TELYCHKO, M.; PROCHÁZKA, P.; KONEČNÝ, M.; BERGER, J.; VONDRÁČEK, M.; ČECHAL, J.; JELÍNEK, P.; ŠVEC, M., 2018: Simple device for the growth of micrometer-sized monocrystalline single-layer graphene on SiC(0001). JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 36(3), p. 031401-1 - 6, doi: 10.1116/1.5008977; FULL TEXT
    (ICON-SPM, UHV-LEEM, TERS)

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