SEM/FIB microscope FEI Versa3D equipped with a Quorum cryo stage and transfer station (Versa)

Guarantor:
Jiří Nováček, Ph.D.
Instrument status:
Operational, 23.3.2021 10:17, FIB source replacement
Research group:
CF: Cryo-Electron Microscopy and Tomography Core Facility
Detailed description:
Dual beam SEM/FIB electron microscope (FEG and gallium ions) equipped with detectors for secondary (SE) and back-scattered (BSE, DBS) electrons and for ions (ICE). Additionally, the microscope is equipped with a Quorum cryo-station for vitrification of biological samples and with a cryo-stage for transfer of vitrified samples and TEM autogrids into the microscope at cryogenic temperatures. Platinum coating of specimen is available both in the cryo-stage and in the microscope.