Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field

PCSN 2017 PROCEEDINGS

SEDLÁKOVÁ, V.; ŠIKULA, J.; KUPAROWITZ, M., 2017: Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field. PCSN 2017 PROCEEDINGS , p. 128 - 9; FULL TEXT

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser

CEITEC authors:

• Vlasta Sedláková, Ph.D.