Ultra High Vacuum Preparation and Analytical System - Low Energy Ion Spectroscopy ION-TOF Qtac 100 (UHV-LEIS)

Detailed description:

Ultra High Vacuum Preparation and Analytical System - Low Energy Ion Spectroscopy ION-TOF Qtac 100

Publications:

• Alcala, R.; DeLaRiva, A.; Peterson, E. J.; Benavidez, A.; Garcia-Vargas, C. E.; Jiang, D.; Pereira-Hernández, X. I.; Brongersma, H. H.; ter Veen, R.; Staněk, J.; Miller, J. T.; Wang, Y.; Datye, A., 2021: Atomically Dispersed Dopants for Stabilizing Ceria Surface Area. APPLIED CATALYSIS B: ENVIRONMENTAL 284, p. 1 - 9, doi: 10.1016/j.apcatb.2020.119722
  (UHV-LEIS)
• AVVAL, T. G.; PRŮŠA, S.; CHAPMAN, S. C.; LINFORD, M. R.; ŠIKOLA, T.; BRONGERSMA, H. H., 2021: Zinc and copper, by high sensitivity-low energy ion scattering. SURFACE SCIENCE SPECTRA 28(1), p. 1 - 8, doi: 10.1116/6.0000953; FULL TEXT
  (UHV-LEIS)
• PRŮŠA, S.; BÁBÍK, P.; MACH, J.; STRAPKO, T.; ŠIKOLA, T.; BRONGERSMA, H., 2020: Calcium and fluorine signals in HS-LEIS for CaF2(111) and powder-Quantification of atomic surface concentrations using LiF(001), Ca, and Cu references. SURFACE SCIENCE SPECTRA 27(2), p. 1 - 13, doi: 10.1116/6.0000325; FULL TEXT
  (UHV-LEIS)
• PRŮŠA, S.; BÁBÍK, P.; ŠIKOLA, T.; BRONGERSMA, H., 2020: Quantitative analysis of calcium and fluorine by high-sensitivity low-energy ion scattering: Calcium fluoride. SURFACE AND INTERFACE ANALYSIS , p. 1000 - 4, doi: 10.1002/sia.6889; FULL TEXT
  (UHV-LEIS)
• UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F., 2020: Single-layer graphene on epitaxial FeRh thin films. APPLIED SURFACE SCIENCE 514, p. 145923-1 - 7, doi: 10.1016/j.apsusc.2020.145923; FULL TEXT
  (MAGNETRON, VERSALAB, RIGAKU9, UHV-LEEM, UHV-LEIS, UHV-SPM, UHV-PREPARATION, UHV-XPS, SIMS)

• FIKÁČEK, J.; PROCHÁZKA, P.; STETSOVYCH, V.; PRŮŠA, S.; VONDRÁČEK, M.; KORMOŠ, L.; SKÁLA, T.; VLAIC, P.; CAHA, O.; CARVA, K.; ČECHAL, J.; SPRINGHOLZ, G.; HONOLKA, J., 2020: Step-edge assisted large scale FeSe monolayer growth on epitaxial Bi(2)Se(3)thin films. NEW JOURNAL OF PHYSICS 22(7), p. 1 - 12, doi: 10.1088/1367-2630/ab9b59; FULL TEXT
  (UHV-LEEM, UHV-XPS, UHV-LEIS, UHV-DEPOSITION, UHV-PREPARATION)
• PRAJZLER, V.; PRŮŠA, S.; MACA, K., 2019: Rapid pressure-less sintering of fine grained zirconia ceramics: Explanation and elimination of a core-shell structure. JOURNAL OF THE EUROPEAN CERAMIC SOCIETY 39(16), p. 5309 - 11, doi: 10.1016/j.jeurceramsoc.2019.07.053; FULL TEXT
  (VERIOS, UHV-LEIS)
• ŠIK, O.; BÁBOR, P.; POLČÁK, J.; BELAS, E.; MORAVEC, P.; GRMELA, L.; STANĚK, J., 2018: Low Energy Ion Scattering as a depth profiling tool for thin layers - Case of bromine Methanol etched CdTe. VACUUM 152, p. 138 - 7, doi: 10.1016/j.vacuum.2018.03.014; FULL TEXT
  (UHV-LEIS, KRATOS-XPS)
• Bábík, P., 2018: Charge exchange processes involved in projectile-target interaction at low energy range studied by HS-LEIS. MASTER´S THESIS , p. 1 - 55
  (UHV-LEIS)
• Horký, M., 2016: Growth of Metastable FCC FE Thin Films on Cu(100)/Si(100) Substrates. MASTER´S THESIS , p. 1 - 96
  (UHV-PREPARATION, UHV-XPS, UHV-SPM, ICON-SPM, LYRA, VERIOS, UHV-LEIS, KRATOS-XPS, RIGAKU3)

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