Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence

ULTRAMICROSCOPY

STÖGER-POLLACH, M.; LÖFFLER, S.; MAURER, N.; BUKVIŠOVÁ, K., 2020: Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence. ULTRAMICROSCOPY 214, p. 1 - 5, doi: 10.1016/j.ultramic.2020.113011; FULL TEXT

Research Groups:

• Fabrication and Characterisation of Nanostructures - Tomáš Šikola

CEITEC authors:

• Kristýna Bukvišová