Workshop Correlative materials characterization
Invitation to the workshop organized by the Czech Optical Cluster “Correlative materials characterization”
The workshop will be dedicated to the exciting field of Correlative Materials Characterization and Correlative Imaging. The aim is to bring together communities from Material and Life Science, discuss and explore common interests in this microscopy phenomenon. The subject is open to all relevant microscopy techniques used for correlative material characterization. The main focus will be on Electron microscopy, Atomic Force Microscopy, X-Ray microscopy, and light microscopy in various forms.
To participate in the workshop is free, but it is necessary to register on the link provided in the Workshop program Correlative characterization of materials at the link above or here: Registration to participate in the workshop
Keynote speakers:
- Ehrenfried Zschech, deepXscan – “Correlative Materials Characterization – Current Status and Perspectives”
- Pavel Tomančák, MPI Dresden, CEITEC – TBA
- Umberto Celano, University of Twente – “Correlative Scanning Probe Microscopy in Site-specific Analysis of Nanoelectronics”