Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate

MATERIALS

SOBOLA, D.; RAMAZANOV, S.; KONEČNÝ, M.; ORUDZHEV, F.; KASPAR, P.; PAPEŽ, N.; KNÁPEK, A.; POTOČEK, M., 2020: Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate . MATERIALS 13(10), p. 1 - 15, doi: 10.3390/ma13102402; FULL TEXT
(SIMS, WITEC-RAMAN, LITESCOPE, LYRA, KRATOS-XPS)

Equipment:

• Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5
• Witec Alpha 300R
• LiteScope
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3
• X-ray Photoelectron Spectroscopy Kratos Analytical Axis Supra

Research Groups:

• Advanced Instrumentation and Methods for Materials Characterization - Jozef Kaiser
• CF: CEITEC Nano

CEITEC authors:

• Dinara Sobola, Ph.D.
• Martin Konečný
• Michal Potoček, Ph.D.